In a method for debugging programs of an electronic device, the method adds an appended block to one or more memory blocks allocated by one or more memory allocation functions of a specified program, so as to obtain one or more appended blocks, stores an identifier of each memory allocation function into a corresponding appended block, and executes a memory leak test to determine one or more unqualified memory allocation functions. The method further searches for one or more identifiers from the appended blocks if the memory leak test fails, and obtains a position of each unqualified memory allocation function in the specified program according to each found identifier if source codes of the specified program are available in a storage device of the electronic device.