Invention Grant
US08371316B2 Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
有权
用于清洁测试仪界面接触元件和支持硬件的设备，设备和方法
- Patent Title: Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
- Patent Title (中): 用于清洁测试仪界面接触元件和支持硬件的设备，设备和方法
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Application No.: US12630714Application Date: 2009-12-03
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Publication No.: US08371316B2Publication Date: 2013-02-12
- Inventor: Alan E. Humphrey , Jerry J. Broz , Bret A. Humphrey , James H. Duvall
- Applicant: Alan E. Humphrey , Jerry J. Broz , Bret A. Humphrey , James H. Duvall
- Applicant Address: US NV Reno
- Assignee: International Test Solutions, Inc.
- Current Assignee: International Test Solutions, Inc.
- Current Assignee Address: US NV Reno
- Agency: DLA Piper LLP (US)
- Main IPC: B08B3/00
- IPC: B08B3/00
Abstract:
A medium for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card and a test socket, while it is still in manual, semi-automated, and automated handling device and the electrical test equipment is disclosed. The cleaning material may include a cleaning pad layer and one or more intermediate layers that have predetermined characteristics.
Public/Granted literature
- US20110132396A1 APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONTACT ELEMENTS AND SUPPORT HARDWARE Public/Granted day:2011-06-09
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