Invention Grant
- Patent Title: Method for manufacturing thin film transistor
- Patent Title (中): 制造薄膜晶体管的方法
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Application No.: US12731210Application Date: 2010-03-25
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Publication No.: US08372700B2Publication Date: 2013-02-12
- Inventor: Hidekazu Miyairi
- Applicant: Hidekazu Miyairi
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
It is an object to provide a method for manufacturing a thin film transistor, in which the number of masks to be used is small. A thin film transistor is manufactured as follows: a first conductive film, an insulating film, a semiconductor film, an impurity semiconductor film, and a second conductive film are stacked; a resist mask having a recessed portion is formed thereover with the use of a multi-tone mask; a thin-film stack body is formed with first etching; a gate electrode layer is formed with second etching in which an etched first conductive film is side-etched; and then a source electrode and a drain electrode and the like are formed. A crystalline semiconductor film is used for the semiconductor film.
Public/Granted literature
- US20100248433A1 Method for Manufacturing Thin Film Transistor Public/Granted day:2010-09-30
Information query
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