Invention Grant
- Patent Title: Method and system for improved nickel silicide
- Patent Title (中): 改善硅化镍的方法和系统
-
Application No.: US12890100Application Date: 2010-09-24
-
Publication No.: US08372750B2Publication Date: 2013-02-12
- Inventor: Amitabh Jain , Peijun Chen , Jorge A. Kittl
- Applicant: Amitabh Jain , Peijun Chen , Jorge A. Kittl
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
According to one embodiment of the invention, a method for nickel silicidation includes providing a substrate having a source region, a gate region, and a drain region, forming a source in the source region and a drain in the drain region, annealing the source and the drain, implanting, after the annealing the source and the drain, a heavy ion in the source region and the drain region, depositing a nickel layer in each of the source and drain regions, and heating the substrate to form a nickel silicide region in each of the source and drain regions by heating the substrate.
Public/Granted literature
- US20110014768A1 METHOD AND SYSTEM FOR IMPROVED NICKEL SILICIDE Public/Granted day:2011-01-20
Information query
IPC分类: