Invention Grant
US08373124B2 Infrared detection circuit, sensor device, and electronic instrument
有权
红外检测电路,传感器装置和电子仪器
- Patent Title: Infrared detection circuit, sensor device, and electronic instrument
- Patent Title (中): 红外检测电路,传感器装置和电子仪器
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Application No.: US12974789Application Date: 2010-12-21
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Publication No.: US08373124B2Publication Date: 2013-02-12
- Inventor: Yasunori Koide
- Applicant: Yasunori Koide
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Global IP Counselors, LLP
- Priority: JP2009-291819 20091224
- Main IPC: G01J5/00
- IPC: G01J5/00

Abstract:
An infrared detection circuit includes a charge transferring transistor, a gate control circuit and a negative potential generating circuit. The charge transferring transistor is disposed between a read node configured to be connected to one end of an infrared detection element and a tank node to transfer an electric charge from the infrared detection element to the tank node. The gate control circuit is connected to a gate of the charge transferring transistor. The negative potential generating circuit is connected to the tank node to set the tank node to a negative electric potential when the charge transferring transistor transfers the electric charge.
Public/Granted literature
- US20110155910A1 INFRARED DETECTION CIRCUIT, SENSOR DEVICE, AND ELECTRONIC INSTRUMENT Public/Granted day:2011-06-30
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