Invention Grant
US08373227B2 Semiconductor device and method having trenches in a drain extension region
有权
在漏极延伸区域中具有沟槽的半导体器件和方法
- Patent Title: Semiconductor device and method having trenches in a drain extension region
- Patent Title (中): 在漏极延伸区域中具有沟槽的半导体器件和方法
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Application No.: US13124219Application Date: 2009-10-06
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Publication No.: US08373227B2Publication Date: 2013-02-12
- Inventor: Jan Sonsky , Anco Heringa
- Applicant: Jan Sonsky , Anco Heringa
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08105606 20081020; WOPCT/IB2009/054360 20091006
- International Application: PCT/IB2009/054360 WO 20091006
- International Announcement: WO2010/046794 WO 20100429
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/76

Abstract:
A semiconductor device comprises a substrate including a first region and a second region of a first conductivity type and a third region between the first and second regions of a second conductivity type opposite to the first conductivity type, and being covered by a dielectric layer. A plurality of trenches laterally extend between the third and second region, are filled with an insulating material, and are separated by active stripes with a doping profile having a depth not exceeding the depth of the trenches wherein each trench terminates before reaching the dielectric layer and is separated from the third region by a substrate portion such that the respective boundaries between the substrate portions and the trenches are not covered by the dielectric layer. A method for manufacturing such a semiconductor device is also disclosed.
Public/Granted literature
- US20110198691A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SUCH A DEVICE Public/Granted day:2011-08-18
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