Invention Grant
US08373227B2 Semiconductor device and method having trenches in a drain extension region 有权
在漏极延伸区域中具有沟槽的半导体器件和方法

  • Patent Title: Semiconductor device and method having trenches in a drain extension region
  • Patent Title (中): 在漏极延伸区域中具有沟槽的半导体器件和方法
  • Application No.: US13124219
    Application Date: 2009-10-06
  • Publication No.: US08373227B2
    Publication Date: 2013-02-12
  • Inventor: Jan SonskyAnco Heringa
  • Applicant: Jan SonskyAnco Heringa
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP08105606 20081020; WOPCT/IB2009/054360 20091006
  • International Application: PCT/IB2009/054360 WO 20091006
  • International Announcement: WO2010/046794 WO 20100429
  • Main IPC: H01L29/66
  • IPC: H01L29/66 H01L21/76
Semiconductor device and method having trenches in a drain extension region
Abstract:
A semiconductor device comprises a substrate including a first region and a second region of a first conductivity type and a third region between the first and second regions of a second conductivity type opposite to the first conductivity type, and being covered by a dielectric layer. A plurality of trenches laterally extend between the third and second region, are filled with an insulating material, and are separated by active stripes with a doping profile having a depth not exceeding the depth of the trenches wherein each trench terminates before reaching the dielectric layer and is separated from the third region by a substrate portion such that the respective boundaries between the substrate portions and the trenches are not covered by the dielectric layer. A method for manufacturing such a semiconductor device is also disclosed.
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