Invention Grant
- Patent Title: Electrical power quality test circuitry and method
- Patent Title (中): 电力质量检测电路及方法
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Application No.: US12512205Application Date: 2009-07-30
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Publication No.: US08373406B2Publication Date: 2013-02-12
- Inventor: Ahmed Mohamed Sayed Ahmed , Gary L. Skibinski , Richard A. Lukaszewski
- Applicant: Ahmed Mohamed Sayed Ahmed , Gary L. Skibinski , Richard A. Lukaszewski
- Applicant Address: US OH Mayfield Heights
- Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee Address: US OH Mayfield Heights
- Agency: Fletcher Yoder, P.C.
- Agent Alexander R. Kuszewski; John M. Miller
- Main IPC: G01R19/22
- IPC: G01R19/22

Abstract:
Electrical power quality test circuitry for testing response of an electrical device to input power disturbances is provided. The test circuitry includes a power structure having a rectifier configured to convert incoming AC voltage to DC voltage on a DC bus, and a power inverter configured to convert DC voltage from the bus to three-phase output AC voltage applied to the electrical device. The test circuitry also includes a control circuit configured to apply control signals to at least the power inverter to emulate at least one of a change in the amplitude of at least one phase of the output AC voltage at least one phase angle of at least one phase of the output AC voltage, and a frequency change for all phases of the output AC voltage.
Public/Granted literature
- US20110025300A1 ELECTRICAL POWER QUALITY TEST CIRCUITRY AND METHOD Public/Granted day:2011-02-03
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