An Institute of Electrical and Electronics Engineers (IEEE) test apparatus includes an IEEE 1394 chip, an IEEE 1394 plug, an IEEE 1394 outlet, a test header, and a switch module. The IEEE 1394 chip, plug and outlet each include a ground pin, two pairs of differential signal pins, and a power pin. The test header includes ground pin sockets, two pairs of differential signal pin sockets, and a power signal pin socket. The three power pins and the power signal pin socket are electrically connected together. The switch module is operable to electrically connect the two pairs of differential signal pins of the IEEE 1394 chip to the two pairs of differential signal pins of the IEEE 1394 plug or electrically connect the two pairs of differential signal pins of the IEEE 1394 chip to the two pairs of differential signal pins of the IEEE 1394 outlet.