Invention Grant
- Patent Title: Low inductance contact probe with conductively coupled plungers
- Patent Title (中): 具有导电耦合柱塞的低电感接触探头
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Application No.: US13465014Application Date: 2012-05-06
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Publication No.: US08373430B1Publication Date: 2013-02-12
- Inventor: Jerzy Roman Sochor
- Applicant: Jerzy Roman Sochor
- Main IPC: G01R1/067
- IPC: G01R1/067 ; H01R12/00 ; H01R43/16

Abstract:
A low inductance contact probe comprises conductively coupled plungers. The plungers have coupling means which enable them to be slidably and non-rotatably engaged. A coil spring is attached to the plungers in a manner that prevents rotation of the spring's ends. The spring provides an axial plunger bias, and a torsional bias for conductive coupling between the plungers. The torsional bias is generated by an axial displacement of the spring and by twisting the spring a predetermined angle prior to attachment to the plungers. Torsion-induced contact forces between the plungers assure a direct conductive path through the plungers. The torsional bias further enables a positive attachment of the spring to the plungers. Plungers with hermaphroditic coupling means can be fabricated from a drawn profiled stock by stamping or machining. Essential plunger coupling features can be prefabricated in a drawn profiled stock with a high degree of dimensional accuracy and reproducibility.
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