Invention Grant
US08373430B1 Low inductance contact probe with conductively coupled plungers 失效
具有导电耦合柱塞的低电感接触探头

  • Patent Title: Low inductance contact probe with conductively coupled plungers
  • Patent Title (中): 具有导电耦合柱塞的低电感接触探头
  • Application No.: US13465014
    Application Date: 2012-05-06
  • Publication No.: US08373430B1
    Publication Date: 2013-02-12
  • Inventor: Jerzy Roman Sochor
  • Applicant: Jerzy Roman Sochor
  • Main IPC: G01R1/067
  • IPC: G01R1/067 H01R12/00 H01R43/16
Low inductance contact probe with conductively coupled plungers
Abstract:
A low inductance contact probe comprises conductively coupled plungers. The plungers have coupling means which enable them to be slidably and non-rotatably engaged. A coil spring is attached to the plungers in a manner that prevents rotation of the spring's ends. The spring provides an axial plunger bias, and a torsional bias for conductive coupling between the plungers. The torsional bias is generated by an axial displacement of the spring and by twisting the spring a predetermined angle prior to attachment to the plungers. Torsion-induced contact forces between the plungers assure a direct conductive path through the plungers. The torsional bias further enables a positive attachment of the spring to the plungers. Plungers with hermaphroditic coupling means can be fabricated from a drawn profiled stock by stamping or machining. Essential plunger coupling features can be prefabricated in a drawn profiled stock with a high degree of dimensional accuracy and reproducibility.
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