Invention Grant
US08373432B2 Automated test equipment employing test signal transmission channel with embedded series isolation resistors
有权
采用带有嵌入式串联隔离电阻的测试信号传输通道的自动测试设备
- Patent Title: Automated test equipment employing test signal transmission channel with embedded series isolation resistors
- Patent Title (中): 采用带有嵌入式串联隔离电阻的测试信号传输通道的自动测试设备
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Application No.: US12724727Application Date: 2010-03-16
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Publication No.: US08373432B2Publication Date: 2013-02-12
- Inventor: Gerald H. Johnson
- Applicant: Gerald H. Johnson
- Applicant Address: US MA North Reading
- Assignee: Teradyne Inc.
- Current Assignee: Teradyne Inc.
- Current Assignee Address: US MA North Reading
- Agency: BainwoodHuang
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/20 ; G01R31/02

Abstract:
Automated test equipment for high-speed testing of devices under test (DUTs) includes a tester channel circuit generating a high-speed electrical test signal applied to the signal input terminal of each DUT, and a contacter board in physical and electrical contact with the DUTs. The contacter board has a high-speed signal transmission channel including (1) an electrical contact at which the high-speed electrical test signal is received, (2) conductive etch extending from the electrical contact to isolation areas each adjacent to the signal input terminal of a respective DUT, and (3) an embedded series isolation resistor formed on an inner layer of the contacter board at a respective isolation area forming a connection between the conductive etch and the adjacent signal input terminal of the respective DUT.
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