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US08373456B2 Domain crossing circuit of a semiconductor memory apparatus 有权
半导体存储装置的域交叉电路

Domain crossing circuit of a semiconductor memory apparatus
Abstract:
The domain crossing circuit of a semiconductor memory apparatus for improving a timing margin includes a sampler that provides a sampling internal signal generated by delaying an internal input signal by a predetermined time in response to a clock and an edge information signal that defines an output timing of the sampling internal signal and an output stage that allows the sampling internal signal to be synchronized with the clock in response to the edge information signal to be output as a final output signal.
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