Invention Grant
- Patent Title: Flat field correction for infrared cameras
- Patent Title (中): 红外摄像机的平场校正
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Application No.: US12391156Application Date: 2009-02-23
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Publication No.: US08373757B1Publication Date: 2013-02-12
- Inventor: Vu L. Nguyen
- Applicant: Vu L. Nguyen
- Applicant Address: US OR Wilsonville
- Assignee: Flir Systems, Inc.
- Current Assignee: Flir Systems, Inc.
- Current Assignee Address: US OR Wilsonville
- Agency: Haynes and Boone, LLP
- Main IPC: H04N5/232
- IPC: H04N5/232

Abstract:
Various techniques are provided to perform flat field correction for infrared cameras. In one example, a method of calibrating an infrared camera includes calibrating a focal plane array (FPA) of the infrared camera to an external scene to determine a set of flat field correction values associated with a first optical path from the external scene to the FPA. The method also includes calibrating the FPA to a shutter of the infrared camera to determine a set of flat field correction values associated with a second optical path from the shutter to the FPA. The method also includes using the flat field correction values associated with the first and second optical paths to calculate a set of supplemental flat field correction values to apply to thermal image data obtained with the infrared camera. The method also includes storing the supplemental flat field correction values.
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