Invention Grant
US08373758B2 Techniques for analyzing performance of solar panels and solar cells using infrared diagnostics
有权
使用红外诊断技术分析太阳能电池板和太阳能电池的性能
- Patent Title: Techniques for analyzing performance of solar panels and solar cells using infrared diagnostics
- Patent Title (中): 使用红外诊断技术分析太阳能电池板和太阳能电池的性能
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Application No.: US12616683Application Date: 2009-11-11
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Publication No.: US08373758B2Publication Date: 2013-02-12
- Inventor: Supratik Guha , Yves C. Martin , Robert L. Sandstrom , Theodore Gerard van Kessel
- Applicant: Supratik Guha , Yves C. Martin , Robert L. Sandstrom , Theodore Gerard van Kessel
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Michael J. Chang, LLC
- Agent Vazken Alexanian
- Main IPC: H04N5/33
- IPC: H04N5/33

Abstract:
Techniques for analyzing performance of solar panels and/or cells are provided. In one aspect, a method for analyzing an infrared thermal image taken using an infrared camera is provided. The method includes the following steps. The infrared thermal image is converted to temperature data. Individual elements are isolated in the infrared thermal image. The temperature data for each isolated element is tabulated. A performance status of each isolated element is determined based on the tabulated temperature data. The individual elements can include solar panels and/or solar cells. In another aspect, an infrared diagnostic system is provided. The infrared diagnostic system includes an infrared camera which can be remotely positioned relative to one or more elements to be imaged; and a computer configured to receive thermal images from the infrared camera, via a communication link, and analyze the thermal images.
Public/Granted literature
- US20110109740A1 Method and Apparatus for In Situ Solar Flat Panel Diagnostics Public/Granted day:2011-05-12
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