Invention Grant
US08373843B2 Exposure apparatus, exposure method, and method for producing device
有权
曝光装置,曝光方法和制造装置的方法
- Patent Title: Exposure apparatus, exposure method, and method for producing device
- Patent Title (中): 曝光装置,曝光方法和制造装置的方法
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Application No.: US11785722Application Date: 2007-04-19
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Publication No.: US08373843B2Publication Date: 2013-02-12
- Inventor: Hiroyuki Nagasaka
- Applicant: Hiroyuki Nagasaka
- Applicant Address: JP Tokyo JP Yokohama-shi
- Assignee: Nikon Corporation,Nikon Engineering Co., Ltd.
- Current Assignee: Nikon Corporation,Nikon Engineering Co., Ltd.
- Current Assignee Address: JP Tokyo JP Yokohama-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-172569 20040610; JP2004-245260 20040825; JP2004-330582 20041115
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42

Abstract:
A lithographic apparatus includes a substrate table to hold a substrate and a projection system to project a patterned radiation beam onto a target portion of the substrate. A liquid supply system at least partly fills a space between the projection system and the substrate with a liquid, and has a liquid confinement structure to at least partly confine the liquid within the space. An outlet removes a mixture of liquid and gas passing through a gap between the liquid confinement structure and the substrate. An evacuation system draws the mixture through the outlet, and includes a separator tank to separate liquid from gas in the mixture and a separator tank pressure controller, connected to a non-liquid-filled region of the separator tank, to maintain a stable pressure within the non-liquid-filled region.
Public/Granted literature
- US20070195301A1 Exposure apparatus, exposure method, and method for producing device Public/Granted day:2007-08-23
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