Invention Grant
US08374802B2 Device and method for radiometric measurement of a plurality of samples
有权
用于多个样品的辐射测量的装置和方法
- Patent Title: Device and method for radiometric measurement of a plurality of samples
- Patent Title (中): 用于多个样品的辐射测量的装置和方法
-
Application No.: US12675764Application Date: 2008-08-29
-
Publication No.: US08374802B2Publication Date: 2013-02-12
- Inventor: Rainer Treptow , Gerd Joachim Eckert , Andreas Schirr , Rainer Schliesser , Norbert Wittschief
- Applicant: Rainer Treptow , Gerd Joachim Eckert , Andreas Schirr , Rainer Schliesser , Norbert Wittschief
- Applicant Address: US DE Hamburg
- Assignee: Eppendorf AG
- Current Assignee: Eppendorf AG
- Current Assignee Address: US DE Hamburg
- Agency: Arnold & Porter LLP
- Agent Todd Lorenz
- International Application: PCT/EP2008/007099 WO 20080829
- International Announcement: WO2009/027102 WO 20090305
- Main IPC: G01N31/00
- IPC: G01N31/00
Abstract:
The invention relates to a method for photometrically investigating sample radiations of at least one sample, which are caused by the radiation of N emitter elements of at least one radiation element wherein said N emitter elements are emitting radiation during time periods which at least partially overlap, to detect the sample radiation of at least two samples as a sum signal during time periods which at least partially overlap and to evaluate the sample radiation of at least one individual sample from said sum signal.
Public/Granted literature
- US20100324834A1 Device and Method for Radiometric Measurement of a Plurality of Samples Public/Granted day:2010-12-23
Information query
