Invention Grant
- Patent Title: X-ray detection signal processing apparatus and method therefor
- Patent Title (中): X射线检测信号处理装置及其方法
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Application No.: US13499581Application Date: 2011-10-26
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Publication No.: US08374814B2Publication Date: 2013-02-12
- Inventor: Yukio Sako
- Applicant: Yukio Sako
- Applicant Address: JP Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-031141 20110216
- International Application: PCT/JP2011/074634 WO 20111026
- International Announcement: WO2012/111195 WO 20120823
- Main IPC: G01R23/02
- IPC: G01R23/02 ; G01R29/027 ; H05G1/64

Abstract:
An X-ray detection signal processing apparatus of the present invention is such that after a signal from a preamplifier has been converted into a digital signal at a high speed by means of a high speed analog-to-digital converter (1), a process for removing influences brought about by a component that has been decayed by a differential time constant in the preamplifier is performed on a digital basis in a digital signal processing block (2). An event detecting unit (3) within the digital signal processing block (2), smoothen the signal from the high speed analog-to-digital converter (1) for a predetermined shaping time with the use of a filter function for high speed shaping, detects as an event information the timing at which the smoothened signal exceeds a predetermined threshold and attains the maximum value, and add such event information to the signal from the high speed analog-to-digital converter (1).
Public/Granted literature
- US20120207277A1 X-RAY DETECTION SIGNAL PROCESSING APPARATUS AND METHOD THEREFOR Public/Granted day:2012-08-16
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