Invention Grant
- Patent Title: System and method for testing a module
- Patent Title (中): 用于测试模块的系统和方法
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Application No.: US12398012Application Date: 2009-03-04
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Publication No.: US08375250B2Publication Date: 2013-02-12
- Inventor: Albrecht Mayer , Wolfram Carl
- Applicant: Albrecht Mayer , Wolfram Carl
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
In an embodiment, a system has a bus interface port, a selection circuit coupled to the bus interface port, a first bus interface circuit coupled to the selection circuit and a second bus interface circuit coupled to the selection circuit. The selection circuit is configured to select between the first bus interface circuit and the second bus interface circuit. The system also has an initialization circuit configured to detect a first codeword written to the bus interface port, and activate the second bus interface circuit if the first codeword is detected.
Public/Granted literature
- US20100229038A1 System and Method for Testing a Module Public/Granted day:2010-09-09
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