Invention Grant
- Patent Title: Photoresist coating and developing apparatus, substrate transfer method and interface apparatus
- Patent Title (中): 光刻胶涂布和显影装置,基片转印方法和界面装置
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Application No.: US12940101Application Date: 2010-11-05
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Publication No.: US08376637B2Publication Date: 2013-02-19
- Inventor: Yoshiaki Yamada , Yuichi Yamamoto , Hitoshi Kosugi , Seiji Fujimoto
- Applicant: Yoshiaki Yamada , Yuichi Yamamoto , Hitoshi Kosugi , Seiji Fujimoto
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2009-259872 20091113
- Main IPC: G03D5/00
- IPC: G03D5/00

Abstract:
A photoresist coating and developing apparatus 1 includes a photoresist film forming unit that forms a photoresist film on a substrate; a heat treatment unit that heats the substrate on which the photoresist film is formed by the photoresist film forming unit; a cooling unit that cools the substrate, on which the photoresist film is formed and which is heated by the heat treatment unit, to normal temperature; a heating unit 61 that heats the substrate, which is cooled to normal temperature by the cooling unit, to a predetermined temperature; a load-lock chamber L1 that unloads the substrate under depressurized atmosphere to expose the photoresist film; and a transfer device 62 that transfers the substrate from the heating unit 61 to the load-lock chamber L1.
Public/Granted literature
- US20110117492A1 PHOTORESIST COATING AND DEVELOPING APPARATUS, SUBSTRATE TRANSFER METHOD AND INTERFACE APPARATUS Public/Granted day:2011-05-19
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