Invention Grant
- Patent Title: Method for forming contact hole structure
- Patent Title (中): 形成接触孔结构的方法
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Application No.: US12850349Application Date: 2010-08-04
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Publication No.: US08377821B2Publication Date: 2013-02-19
- Inventor: Jiaxiang Nie
- Applicant: Jiaxiang Nie
- Applicant Address: CN Shanghai CN Beijing
- Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee Address: CN Shanghai CN Beijing
- Agency: Squire Sanders (US) LLP
- Priority: CN200910056025 20090806
- Main IPC: H01L21/4763
- IPC: H01L21/4763

Abstract:
The invention discloses a method for forming a contact hole structure, including: providing a substrate, the substrate having a surface where a metal layer is formed; forming on the surface of the substrate a dielectric layer covering the metal layer; etching the dielectric layer to form a contact hole exposing the metal layer; forming a barrier layer on sidewalls of the contact hole and an exposed surface of the metal layer; removing the barrier layer on the surface of the metal layer by sputtering, and performing sputtering on the metal layer; and, filling the contact hole with an electrically conductive material. The invention protects the dielectric layer from being damaged and improves the quality of the formation of the contact hole, and the sputtering performed on the metal layer and the subsequent filling of the contact hole with the electrically conductive material may use the same apparatus, which reduces processing steps and improves efficiency.
Public/Granted literature
- US20110034025A1 Method for Forming Contact Hole Structure Public/Granted day:2011-02-10
Information query
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