Invention Grant
- Patent Title: Substrate for a probe card assembly
- Patent Title (中): 基板用于探针卡组件
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Application No.: US11943105Application Date: 2007-11-20
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Publication No.: US08378704B2Publication Date: 2013-02-19
- Inventor: Seiichirou Itou , Masashi Miyawaki , Takeshi Oyamada
- Applicant: Seiichirou Itou , Masashi Miyawaki , Takeshi Oyamada
- Applicant Address: JP Kyoto
- Assignee: Kyocera Corporation
- Current Assignee: Kyocera Corporation
- Current Assignee Address: JP Kyoto
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2007-018932 20070130; JP2007-047346 20070227; JP2007-223470 20070830
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A substrate is provided for a probe card assembly. The substrate includes an interconnection layer including a first surface having a first electrode set and a second surface having a second electrode set electrically connected to the first electrode set. The substrate further includes a base layer including a first surface having a third electrode set electrically connected to the second electrode set and a second surface having a plurality of contact terminals electrically connected to the third electrode set. And the substrate further includes a resin layer including a plurality of sublayers made of different materials. The resin layer is attached to the first surface of the base layer and the second surface of the interconnection layer.
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