Invention Grant
- Patent Title: Word line fault detection
- Patent Title (中): 字线故障检测
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Application No.: US13169397Application Date: 2011-06-27
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Publication No.: US08379468B2Publication Date: 2013-02-19
- Inventor: Ravindraraj Ramaraju , Alexander B. Hoefler
- Applicant: Ravindraraj Ramaraju , Alexander B. Hoefler
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent James L. Clingan, Jr.; Joanna G. Chiu
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
In a memory having a word line driver and a ROM having N bit positions and a plurality of rows in which each row is coupled to a corresponding word line of the word line driver and stores a unique N bit value, a method includes activating, by the word line driver, a selected word line, and, for each bit position, determining whether a value of a true bit line of the bit position is at a same logic state as a value of a complementary bit line of the bit position when the word line driver activates the selected word line. In response to determining that a value of the true bit line is at the same logic state as the value of the complementary bit line for any of the N bit positions, providing a multiple word line fault indicator indicating that multiple word lines are activated simultaneously.
Public/Granted literature
- US20120327699A1 WORD LINE FAULT DETECTION Public/Granted day:2012-12-27
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