Invention Grant
- Patent Title: Method and device for predicting a figure of merit from a distribution
- Patent Title (中): 从分布中预测品质因数的方法和装置
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Application No.: US12415449Application Date: 2009-03-31
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Publication No.: US08379754B2Publication Date: 2013-02-19
- Inventor: Stefan Erb
- Applicant: Stefan Erb
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H04L27/10
- IPC: H04L27/10
Abstract:
Embodiments of the invention relate to methods and devices for predicting a figure of merit from a distribution at least including scalably normalizing the distribution to approximate a predetermined part of the normalized distribution.
Public/Granted literature
- US20100246650A1 Method and Device for Predicting a Figure of Merit From a Distribution Public/Granted day:2010-09-30
Information query
