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US08381049B2 Apparatus and method for testing shadow logic 有权
用于测试阴影逻辑的装置和方法

Apparatus and method for testing shadow logic
Abstract:
A system for testing faults in shadow logic includes a sequential block coupled to a shadow logic block and a delaying block to receive test patterns for testing the shadow logic block. The delaying block delays the test patterns by an access time of the sequential block to generate delayed test patterns. The delayed test patterns are passed to the shadow logic block for testing faults.
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