Invention Grant
- Patent Title: Variable sector-count ECC
- Patent Title (中): 可变扇区数ECC
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Application No.: US12897260Application Date: 2010-10-04
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Publication No.: US08381076B2Publication Date: 2013-02-19
- Inventor: William H. Radke
- Applicant: William H. Radke
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Improved memory devices, circuitry, and data methods are described that facilitate the detection and correction of data in memory systems or devices by increasing the data area of user data being covered by the ECC code. This averages any possible bit errors over a larger data area and allows a greater number of errors to be corrected by a combining the ECC codes in the coverage area without substantially changing the overall size of ECC codes being stored over a single sector approach. In one embodiment of the present invention, the size of the data block utilized for ECC coverage is variable and can be selected such that differing areas of the memory array or data types can have a differing ECC data coverage sizes. It is also noted that the ECC algorithm, math base or encoding scheme can also be varied between these differing areas of the memory array.
Public/Granted literature
- US20110022932A1 VARIABLE SECTOR-COUNT ECC Public/Granted day:2011-01-27
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