Invention Grant
US08381149B2 Timing analysis apparatus, timing analysis method, and timing analysis program
有权
时序分析装置,时序分析方法和时序分析程序
- Patent Title: Timing analysis apparatus, timing analysis method, and timing analysis program
- Patent Title (中): 时序分析装置,时序分析方法和时序分析程序
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Application No.: US12923887Application Date: 2010-10-13
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Publication No.: US08381149B2Publication Date: 2013-02-19
- Inventor: Yoshitaka Horikoshi
- Applicant: Yoshitaka Horikoshi
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2009-249445 20091029
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A timing analysis apparatus includes a circuit data acquisition section for acquiring circuit data; a path setup section for setting up two paths extending from a clock source to a clock supply destination as a first path and a second path in accordance with the circuit data; a distance calculation section for calculating a coupling point-to-point distance between a first output terminal of the mesh section on the first path and a second output terminal of the mesh section on the second path; a global coefficient decision section for determining, in accordance with the coupling point-to-point distance, a global coefficient that indicates the degree of variation in time period from the moment when a clock signal is issued from the clock source until the moment when the clock signal reaches each output terminal of the mesh section; and a timing verification section for verifying clock supply timing on each of the first path and the second path in accordance with the global coefficient.
Public/Granted literature
- US20110107285A1 Timing analysis apparatus, timing analysis method, and timing analysis program Public/Granted day:2011-05-05
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