Invention Grant
- Patent Title: System and method for object metrology
- Patent Title (中): 对象计量系统和方法
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Application No.: US12853900Application Date: 2010-08-10
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Publication No.: US08381976B2Publication Date: 2013-02-26
- Inventor: Mohammed Ibrahim Mohideen , Isaac Cohen
- Applicant: Mohammed Ibrahim Mohideen , Isaac Cohen
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G06K15/00
- IPC: G06K15/00
Abstract:
A system includes a time of flight (TOF) camera or similar device, a processor coupled to the TOF camera, and a sensor. The processor receives TOF data from the sensor. The TOF data is related to an object within range of the TOF device. The processor calculates dimensions of the object using the time of flight data.
Public/Granted literature
- US20120037705A1 SYSTEM AND METHOD FOR OBJECT METROLOGY Public/Granted day:2012-02-16
Information query
