Invention Grant
US08381980B2 Evaluating an electromagnetic field strength of an electromagnetic gate apparatus 有权
评估电磁门装置的电磁场强度

  • Patent Title: Evaluating an electromagnetic field strength of an electromagnetic gate apparatus
  • Patent Title (中): 评估电磁门装置的电磁场强度
  • Application No.: US12811962
    Application Date: 2009-01-08
  • Publication No.: US08381980B2
    Publication Date: 2013-02-26
  • Inventor: Gerald WiednigMichael BuchmannRonny Schomacker
  • Applicant: Gerald WiednigMichael BuchmannRonny Schomacker
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP08100250 20080109
  • International Application: PCT/IB2009/050067 WO 20090108
  • International Announcement: WO2009/087599 WO 20090716
  • Main IPC: G06K19/06
  • IPC: G06K19/06
Evaluating an electromagnetic field strength of an electromagnetic gate apparatus
Abstract:
A device (110) for evaluating an electromagnetic field strength/field geometry of an electromagnetic gate apparatus (120) is provided, the device (110) comprising a measurement unit (112) adapted for receiving a measurement signal from the electromagnetic gate apparatus (120) and determining a value of the field strength of said measurement signal, a communication unit (114) adapted for receiving command data from the electromagnetic gate apparatus (120) and adapted for sending response datato the electromagnetic gate apparatus (120). Optionally, the device (110) comprises an evaluation unit (116,118) adapted for evaluating the electromagnetic field geometry of the electromagnetic gate apparatus (120) based on said values of the field strength received from the measurement unit (112).
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