Invention Grant
- Patent Title: Evaluating an electromagnetic field strength of an electromagnetic gate apparatus
- Patent Title (中): 评估电磁门装置的电磁场强度
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Application No.: US12811962Application Date: 2009-01-08
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Publication No.: US08381980B2Publication Date: 2013-02-26
- Inventor: Gerald Wiednig , Michael Buchmann , Ronny Schomacker
- Applicant: Gerald Wiednig , Michael Buchmann , Ronny Schomacker
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08100250 20080109
- International Application: PCT/IB2009/050067 WO 20090108
- International Announcement: WO2009/087599 WO 20090716
- Main IPC: G06K19/06
- IPC: G06K19/06

Abstract:
A device (110) for evaluating an electromagnetic field strength/field geometry of an electromagnetic gate apparatus (120) is provided, the device (110) comprising a measurement unit (112) adapted for receiving a measurement signal from the electromagnetic gate apparatus (120) and determining a value of the field strength of said measurement signal, a communication unit (114) adapted for receiving command data from the electromagnetic gate apparatus (120) and adapted for sending response datato the electromagnetic gate apparatus (120). Optionally, the device (110) comprises an evaluation unit (116,118) adapted for evaluating the electromagnetic field geometry of the electromagnetic gate apparatus (120) based on said values of the field strength received from the measurement unit (112).
Public/Granted literature
- US20100282848A1 EVALUATING AN ELECTROMAGNETIC FIELD STRENGHT OF AN ELECTROMAGNETIC GATE APPARATUS Public/Granted day:2010-11-11
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