Invention Grant
- Patent Title: Non-invasive determination of characteristics of a sample
- Patent Title (中): 非侵入性测定样品的特征
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Application No.: US12621483Application Date: 2009-11-18
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Publication No.: US08382668B2Publication Date: 2013-02-26
- Inventor: David James Harra , Aiguo Xu
- Applicant: David James Harra , Aiguo Xu
- Applicant Address: US NV Reno
- Assignee: RF Science & Technology Inc.
- Current Assignee: RF Science & Technology Inc.
- Current Assignee Address: US NV Reno
- Agency: Woodcock Washburn LLP
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B5/05

Abstract:
Systems and methods for non-invasively scanning and analyzing one or more characteristics of a sample utilizing electromagnetic radiation are described. More particularly, the systems and methods utilize an electromagnetic radiation source connected to a transmitter and an analyzer connected to a receiver. A sample to be analyzed is placed between the transmitter and receiver in a variety of different manners and a frequency sweep of electromagnetic radiation is transmitted through the sample to create a series of spectral data sets that are used to create one or more composite spectrograms, which are then analyzed to determine one or more characteristics of the sample. A magnetic field can alternatively be applied around the transmitter, receiver and sample to enhance some characteristic analysis applications. Samples include inert and living items, and the characteristics include a wide variety of different applications.
Public/Granted literature
- US20100072386A1 Non-Invasive Determination of Characteristics of a Sample Public/Granted day:2010-03-25
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