Invention Grant
- Patent Title: Method for forming buffer layer for GaN single crystal
- Patent Title (中): GaN单晶缓冲层形成方法
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Application No.: US12433949Application Date: 2009-05-01
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Publication No.: US08383494B2Publication Date: 2013-02-26
- Inventor: Kyung Seob Han , Jeong Heo , Hyeong Jun Kim , Seung Kil Lee
- Applicant: Kyung Seob Han , Jeong Heo , Hyeong Jun Kim , Seung Kil Lee
- Applicant Address: KR Siheung-Si, Gyeonggi-Do
- Assignee: Grand Tech Co., Ltd
- Current Assignee: Grand Tech Co., Ltd
- Current Assignee Address: KR Siheung-Si, Gyeonggi-Do
- Agency: Kile Park Goekjian Reed & McManus PLLC
- Priority: KR10-2008-0041345 20080502
- Main IPC: H01L21/36
- IPC: H01L21/36 ; C30B23/00 ; C30B29/38

Abstract:
Disclosed is a method for forming a buffer layer for growing gallium nitride single crystals on a sapphire substrate using hydride vapor phase epitaxy (HVPE), wherein the buffer layer is formed in the form of a doped vertical gallium nitride (GaN) single crystal film with a nanoporosity of 0.10 to 0.15 μm on the sapphire substrate by reacting HCl and NH3 as a Group III/V mix gas.The nanoporous buffer layer interposed on the interface between the sapphire substrate and gallium nitride reduces tensile stress generated by the difference in thermal expansion coefficient between gallium nitride and the sapphire substrate, enables growth of the gallium nitride layer to a thickness of 1 micrometer (μm) to several millimeters (mm) without causing cracks, and reduces the lattice constant difference to improve crystallinity.
Public/Granted literature
- US20090275190A1 METHOD FOR FORMING BUFFER LAYER FOR GaN SINGLE CRYSTAL Public/Granted day:2009-11-05
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