A dielectric ceramic which is capable of achieving a laminated ceramic capacitor with high reliability, in particular, favorable lifetime characteristics in a load test, even when a dielectric ceramic layer is reduced in thickness contains one of (Ba,R)(Ti,Mn)O3 and (Ba,Ca,R)(Ti,Mn)O3 (R being La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, and/or Y) as a main component, and M (M being Fe, Co, V, W, Cr, Mo, Cu, Al, and/or Mg) and Si as accessory components. The area of a region in which M is present is 10% or less on average of a cross section of each main component grain.