Invention Grant
- Patent Title: Minute particle analyzing device and method
- Patent Title (中): 分粒子分析装置及方法
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Application No.: US12829070Application Date: 2010-07-01
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Publication No.: US08384045B2Publication Date: 2013-02-26
- Inventor: Koji Takasaki , Katsuhiro Seo , Mitsuru Toishi , Shinji Yamada , Atsushi Fukumoto , Gary Durack
- Applicant: Koji Takasaki , Katsuhiro Seo , Mitsuru Toishi , Shinji Yamada , Atsushi Fukumoto , Gary Durack
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Main IPC: G01N21/64
- IPC: G01N21/64
Abstract:
A minute particle analyzing device includes: a light source; a first condenser lens for condensing light from the light source to a first end of a multimode optical fiber; a second condenser lens for condensing the light emerging from a second end of the multimode optical fiber to a minute particle; and a detector for detecting light generated from the minute particle by the application of the light from the light source.
Public/Granted literature
- US20120001090A1 MINUTE PARTICLE ANALYZING DEVICE AND METHOD Public/Granted day:2012-01-05
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