Invention Grant
US08384048B2 Charged particle beam deflection method with separate stage tracking and stage positional error signals
有权
带电粒子束偏转方法具有单独的阶段跟踪和平台位置误差信号
- Patent Title: Charged particle beam deflection method with separate stage tracking and stage positional error signals
- Patent Title (中): 带电粒子束偏转方法具有单独的阶段跟踪和平台位置误差信号
-
Application No.: US12146331Application Date: 2008-06-25
-
Publication No.: US08384048B2Publication Date: 2013-02-26
- Inventor: John C. Wiesner
- Applicant: John C. Wiesner
- Applicant Address: US CA Santa Clara
- Assignee: Multibeam Corporation
- Current Assignee: Multibeam Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Groover & Associates PLLC
- Agent Robert O. Groover, III; Seth Horwitz
- Main IPC: G01N23/00
- IPC: G01N23/00

Abstract:
The invention provides a method for patterning a resist coated substrate carried on a stage, where the patterning utilizes a charged particle beam. The method comprises the steps of: moving the stage at a nominally constant velocity in a first direction; while the stage is moving, deflecting the charged particle beam in the first direction to compensate for the movement of the stage, the deflecting including: (a) compensating for an average velocity of the stage; and (b) separately compensating for the difference between an instantaneous position of the stage and a calculated position based on the average velocity. The separately compensating step uses a bandwidth of less than 10 MHz. The invention also provides a deflector control circuit for implementing the separate compensation functions.
Public/Granted literature
- US20080315112A1 CHARGED PARTICLE BEAM DEFLECTION METHOD WITH SEPARATE STAGE TRACKING AND STAGE POSITIONAL ERROR SIGNALS Public/Granted day:2008-12-25
Information query