Invention Grant
US08384048B2 Charged particle beam deflection method with separate stage tracking and stage positional error signals 有权
带电粒子束偏转方法具有单独的阶段跟踪和平台位置误差信号

  • Patent Title: Charged particle beam deflection method with separate stage tracking and stage positional error signals
  • Patent Title (中): 带电粒子束偏转方法具有单独的阶段跟踪和平台位置误差信号
  • Application No.: US12146331
    Application Date: 2008-06-25
  • Publication No.: US08384048B2
    Publication Date: 2013-02-26
  • Inventor: John C. Wiesner
  • Applicant: John C. Wiesner
  • Applicant Address: US CA Santa Clara
  • Assignee: Multibeam Corporation
  • Current Assignee: Multibeam Corporation
  • Current Assignee Address: US CA Santa Clara
  • Agency: Groover & Associates PLLC
  • Agent Robert O. Groover, III; Seth Horwitz
  • Main IPC: G01N23/00
  • IPC: G01N23/00
Charged particle beam deflection method with separate stage tracking and stage positional error signals
Abstract:
The invention provides a method for patterning a resist coated substrate carried on a stage, where the patterning utilizes a charged particle beam. The method comprises the steps of: moving the stage at a nominally constant velocity in a first direction; while the stage is moving, deflecting the charged particle beam in the first direction to compensate for the movement of the stage, the deflecting including: (a) compensating for an average velocity of the stage; and (b) separately compensating for the difference between an instantaneous position of the stage and a calculated position based on the average velocity. The separately compensating step uses a bandwidth of less than 10 MHz. The invention also provides a deflector control circuit for implementing the separate compensation functions.
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