Invention Grant
- Patent Title: Interconnect structure
- Patent Title (中): 互连结构
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Application No.: US13099698Application Date: 2011-05-03
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Publication No.: US08384164B1Publication Date: 2013-02-26
- Inventor: Jonathan Jung-Ching Ho
- Applicant: Jonathan Jung-Ching Ho
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent Michael T. Wallace; Thomas George
- Main IPC: H01L27/088
- IPC: H01L27/088

Abstract:
An interconnect structure includes a substrate, a first diffusion region within the substrate, a plurality of first lines on the substrate and the first diffusion region, a first enclosure coupled to an end of the plurality of first lines, and a first contact within the first enclosure. The interconnect structure further includes a second diffusion region within the substrate, a plurality of second lines on the substrate and the second diffusion region, a second enclosure coupled to an end of the plurality of second lines, and a second contact within the second enclosure. A spacing can be present between the plurality of first lines and the plurality of second lines. The plurality of first lines, the first contact, the plurality of second lines, and the second contact are trimmed, but the first enclosure, the second enclosure, and the spacing are not trimmed.
Information query
IPC分类: