Invention Grant
- Patent Title: Capacitance measurement circuit and method therefor
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Application No.: US12884886Application Date: 2010-09-17
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Publication No.: US08384400B2Publication Date: 2013-02-26
- Inventor: Shih-Tzung Chou , Yong-Nien Rao , Yu Kuang
- Applicant: Shih-Tzung Chou , Yong-Nien Rao , Yu Kuang
- Applicant Address: TW Hsinchu County
- Assignee: Raydium Semiconductor Corporation
- Current Assignee: Raydium Semiconductor Corporation
- Current Assignee Address: TW Hsinchu County
- Priority: TW98133153A 20090930
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A capacitance measurement circuit includes an operation amplifier; a reference capacitor having a first terminal coupled to a first input terminal of the operation amplifier and a second terminal selectively coupled to a first or second reference voltage; a sensor capacitor having a first terminal coupled to a second input terminal of the operation amplifier and a second terminal selectively coupled to the first or second reference voltage; an approximation unit having an output terminal and an input terminal coupled to an output terminal of the operation amplifier; a conversion unit having an output terminal and an input terminal coupled to the output terminal of the approximation unit; and a coupling capacitor having a first terminal coupled to the first or second input terminal of the operation amplifier and a second terminal coupled to the output terminal of the conversion unit.
Public/Granted literature
- US20110074446A1 Capacitance Measurement Circuit and Method Therefor Public/Granted day:2011-03-31
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