An analog-to-digital conversion circuit includes: comparators to compare an input analog signal and one of reference voltages corresponding to each operation in an analog-to-digital conversion; an interpolating comparator to compare the input analog signal and a determination voltage between first and second reference voltages corresponding to two comparators; a correction value acquisition circuit to calculate a correction value to correct an error between the input analog signal and the determination voltage; a correction value application circuit to set the correction value in the interpolating comparator; a test voltage generation circuit to supply the two comparators with a first test voltage corresponding to one of the determination voltages; a common voltage generation circuit to supply the two comparators with a second test voltage; and a correction value calculation circuit to calculate respective correction values corresponding to the determination voltages based on errors corresponding to the first and second test voltages.