Invention Grant
- Patent Title: Measuring method and measuring device
- Patent Title (中): 测量方法和测量装置
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Application No.: US12891900Application Date: 2010-09-28
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Publication No.: US08384913B2Publication Date: 2013-02-26
- Inventor: You Sasaki , Kazuhiro Ogawa , Takaaki Yamazaki , Shigeyuki Yamaguchi , Ryousuke Miyoshi
- Applicant: You Sasaki , Kazuhiro Ogawa , Takaaki Yamazaki , Shigeyuki Yamaguchi , Ryousuke Miyoshi
- Applicant Address: JP Tokyo-to
- Assignee: Kabushiki Kaisha TOPCON
- Current Assignee: Kabushiki Kaisha TOPCON
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2009-229188 20091001
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
The invention provides a measuring method for installing a measuring rod 6 in a predetermined relation with respect to a coordinate system set to a mobile object 1, for transcribing a predetermined position of the measuring rod on a ground surface where the mobile object is set, for transcribing a measuring point of an object to be measured as set on the mobile object to the ground surface, for measuring a distance on the ground surface between the transcribed predetermined position and the transcribed measuring point, for obtaining a relation between the measuring point and the measuring rod on the ground based on a result of distance measurement, and for obtaining a position on a horizontal coordinate plane in the coordinate system of the measuring point based on the obtained relation and on the relation with the measuring rod with respect to the coordinate system, and the invention also provides a method for measuring a vertical distance between the predetermined position and the ground surface and a vertical distance between the measuring point and the ground surface, and for measuring three-dimensional position of the measuring point in the coordinate system.
Public/Granted literature
- US20110080596A1 Measuring Method And Measuring Device Public/Granted day:2011-04-07
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