Invention Grant
US08385629B2 Method for acquiring phase information and system for measuring three dimensional surface profiles
失效
用于获取相位信息的方法和用于测量三维表面轮廓的系统
- Patent Title: Method for acquiring phase information and system for measuring three dimensional surface profiles
- Patent Title (中): 用于获取相位信息的方法和用于测量三维表面轮廓的系统
-
Application No.: US12511260Application Date: 2009-07-29
-
Publication No.: US08385629B2Publication Date: 2013-02-26
- Inventor: Liang-Chia Chen , Hsuan-Wei Ho
- Applicant: Liang-Chia Chen , Hsuan-Wei Ho
- Applicant Address: TW Taipei
- Assignee: National Taipei University of Technology
- Current Assignee: National Taipei University of Technology
- Current Assignee Address: TW Taipei
- Agency: WPAT PC
- Agent Justin King
- Priority: TW98102814A 20090123
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/76 ; G06K9/62 ; G06K9/40

Abstract:
The present invention provides a band-pass filter, being capable of fitting a frequency spectrum area having phase information in a frequency spectrum image, to obtain a spectrum information corresponding to the phase information during the process of obtaining the phase information from the frequency spectrum image with respect to an object's surface profile. In another embodiment, the present invention further provides a method to optimize the spectrum range of the band-pass filter so as to enhance measuring accuracy and efficiency while restoring the surface of the object. In addition, by employing the foregoing method, the present invention further provides a measurement system for measuring three-dimensional surface shapes in which a deformed fringe pattern with respect to the measured object's surface is acquired and the phase information is obtained from the fringe pattern according to the foregoing method so as to restore the surface profile of the measured object.
Public/Granted literature
- US20100189372A1 METHOD FOR ACQUIRING PHASE INFORMATION AND SYSTEM FOR MEASURING THREE DIMENSIONAL SURFACE PROFILES Public/Granted day:2010-07-29
Information query