Invention Grant
- Patent Title: Fault localization using directed test generation
- Patent Title (中): 使用定向测试生成的故障定位
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Application No.: US12873816Application Date: 2010-09-01
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Publication No.: US08387018B2Publication Date: 2013-02-26
- Inventor: Shay Artzi , Julian Dolby , Marco Pistoia , Frank Tip
- Applicant: Shay Artzi , Julian Dolby , Marco Pistoia , Frank Tip
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Fleit Gibbons Gutman Bongini & Bianco PL
- Agent Jon A. Gibbons
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/00

Abstract:
Disclosed is a novel computer implemented system, on demand service, computer program product and a method for fault-localization techniques that apply statistical analyses to execution data gathered from multiple tests. The present invention determines the fault-localization effectiveness of test suites generated according to several test-generation techniques based on combined concrete and symbolic (concolic) execution. These techniques are evaluated by applying the Ochiai fault-localization technique to generated test suites in order to localize 35 faults in four PHPWeb applications. The results show that the test-generation techniques under consideration produce test suites with similar high fault-localization effectiveness, when given a large time budget.
Public/Granted literature
- US20120054552A1 FAULT LOCALIZATION USING DIRECTED TEST GENERATION Public/Granted day:2012-03-01
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