Invention Grant
- Patent Title: Printing device, discharge test device and discharge test method
- Patent Title (中): 印刷装置,放电试验装置和放电试验方法
-
Application No.: US12917098Application Date: 2010-11-01
-
Publication No.: US08388089B2Publication Date: 2013-03-05
- Inventor: Sukehiro Ito
- Applicant: Sukehiro Ito
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2009-259689 20091113
- Main IPC: B41J29/38
- IPC: B41J29/38 ; B41J29/393 ; B41J2/135

Abstract:
A discharge test device including: a head that includes a plurality of nozzles discharging liquid to a medium, a temperature obtaining section that obtains a temperature related to the head, a detection electrode that faces the head with a predetermined distance therebetween, an identification section that applies a predetermined voltage to the detection electrode and identifies an abnormal nozzle on the basis of voltage change of the detection electrode generated by liquid discharge from the nozzles, and a control section that controls the head and the identification section so that: when the temperature obtained by the temperature obtaining section is within a first temperature range, the head discharges the liquid to the medium after the identification section identifies the abnormal nozzle, when the temperature obtained by the temperature obtaining section is outside the first temperature range and within a second temperature range that is larger than the first temperature range, the head discharges the liquid to the medium without the abnormal nozzle being identified by the identification section, and when the temperature obtained by the temperature obtaining section is outside the second temperature range, the abnormal nozzle is not identified and the liquid is not discharged to the medium.
Public/Granted literature
- US20110115841A1 Printing Device, Discharge Test Device and Discharge Test Method Public/Granted day:2011-05-19
Information query
IPC分类: