Invention Grant
- Patent Title: Integrity testable multilayered filter device
- Patent Title (中): 完整性可测试多层过滤装置
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Application No.: US13197185Application Date: 2011-08-03
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Publication No.: US08388843B2Publication Date: 2013-03-05
- Inventor: Kevin Rautio
- Applicant: Kevin Rautio
- Applicant Address: US MA Billerica
- Assignee: EMD Millipore Corporation
- Current Assignee: EMD Millipore Corporation
- Current Assignee Address: US MA Billerica
- Agency: EMD Millipore Corporation
- Main IPC: B01D35/30
- IPC: B01D35/30 ; B01D27/14 ; B01D29/58

Abstract:
The present invention relates to a device having two or more separate filtration layers that can be independently tested for integrity yet which allow for serial filtration through the two or more layers to obtain the desired characteristics such as retention. The device is made of two or more filtration areas, each containing one filter layer. Each area has one filtration layer and a first endcap bonded to a first end of the filter and a second endcap bonded to a second end of the filter. The areas are arranged concentrically around each other such that the first area is inward of the second area which is inward of a third area and the like. Each area is formed separately and integrity tested separately before final assembly. The first area is slid into the inside of the second area and then the two endcaps are either bonded to each, bonded to a third overall endcap or overmolded by a third endcap.
Public/Granted literature
- US20110283513A1 Integrity Testable Multilayered Filter Device Public/Granted day:2011-11-24
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