Invention Grant
- Patent Title: Method of fabricating a transistor
- Patent Title (中): 制造晶体管的方法
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Application No.: US13196606Application Date: 2011-08-02
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Publication No.: US08389364B2Publication Date: 2013-03-05
- Inventor: Sang Don Lee
- Applicant: Sang Don Lee
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Marshall, Gerstein & Borun LLP
- Priority: KR10-2008-0050941 20080530
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method of fabricating a saddle-fin transistor may include: forming a buffer oxide film and a hard mask oxide film over a semiconductor substrate; etching the buffer oxide film, the hard mask oxide film and the semiconductor substrate corresponding to a mask pattern to form a trench corresponding to a gate electrode and a fin region; oxidizing the exposed semiconductor substrate in the trench to form a gate oxide film; depositing a gate lower electrode in the trench; and depositing a gate upper electrode over the gate lower electrode to fill the trench.
Public/Granted literature
- US20110287599A1 Method of Fabricating a Transistor Public/Granted day:2011-11-24
Information query
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