Invention Grant
- Patent Title: System for fast ions generation and a method thereof
- Patent Title (中): 快速离子产生系统及其方法
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Application No.: US13140377Application Date: 2009-12-20
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Publication No.: US08389954B2Publication Date: 2013-03-05
- Inventor: Arie Zigler , Shmuel Eisenmann , Tala Palchan
- Applicant: Arie Zigler , Shmuel Eisenmann , Tala Palchan
- Applicant Address: IL Jerusalem
- Assignee: Yissum Research Development Company of the Hebrew University of Jerusalem, Ltd.
- Current Assignee: Yissum Research Development Company of the Hebrew University of Jerusalem, Ltd.
- Current Assignee Address: IL Jerusalem
- Agency: Frommer Lawrence & Haug LLP
- Agent William S. Frommer
- International Application: PCT/IL2009/001201 WO 20091220
- International Announcement: WO2010/070648 WO 20100624
- Main IPC: H01J27/24
- IPC: H01J27/24 ; H01J49/16

Abstract:
The present invention discloses a system and method for generating a beam of fast ions. The system comprising: a target substrate having a patterned surface, a pattern comprising nanoscale pattern features oriented substantially uniformly along a common axis; and; a beam unit adapted for receiving a high power coherent electromagnetic radiation beam and focusing it onto said patterned surface of the target substrate to cause interaction between said radiation beam and said substrate enabling creation of fast ions.
Public/Granted literature
- US20110248181A1 SYSTEM FOR FAST IONS GENERATION AND A METHOD THEREOF Public/Granted day:2011-10-13
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