Invention Grant
US08390779B2 Exposure apparatus, exposure method, and method for producing device
有权
曝光装置,曝光方法和制造装置的方法
- Patent Title: Exposure apparatus, exposure method, and method for producing device
- Patent Title (中): 曝光装置,曝光方法和制造装置的方法
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Application No.: US11707079Application Date: 2007-02-16
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Publication No.: US08390779B2Publication Date: 2013-03-05
- Inventor: Hiroyuki Nagasaka
- Applicant: Hiroyuki Nagasaka
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-039832 20060216
- Main IPC: G03B27/42
- IPC: G03B27/42

Abstract:
An exposure apparatus includes a projection optical system which is capable of forming an image of a first pattern in a first exposure area and which is capable of forming an image of a second pattern in a second exposure area, the second pattern being different from the first pattern, and a first detecting system which obtains at least one of position information about the image of the first pattern and position information about the image of the second pattern. A positional relationship between the images of the first and second patterns and a predetermined area on a substrate is adjusted based on a detection result to perform multiple exposure for the predetermined area on the substrate with the images of the first and second patterns. The substrate can be subjected to the multiple exposure efficiently.
Public/Granted literature
- US20070279606A1 Exposure apparatus, exposure method, and method for producing device Public/Granted day:2007-12-06
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