Invention Grant
- Patent Title: Detecting electrical conduction abnormalities in a heart
- Patent Title (中): 检测心脏中的电传导异常
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Application No.: US12463470Application Date: 2009-05-11
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Publication No.: US08391964B2Publication Date: 2013-03-05
- Inventor: Shailesh Kumar V. Musley , Vincent E. Splett , Aleksandre T. Sambelashvili
- Applicant: Shailesh Kumar V. Musley , Vincent E. Splett , Aleksandre T. Sambelashvili
- Applicant Address: US MN Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: US MN Minneapolis
- Agent Stephen W. Bauer; Michael J. Ostrom
- Main IPC: A61B5/04
- IPC: A61B5/04

Abstract:
Techniques are described for detecting conduction abnormalities in a heart of a patient. In particular, an IMD may be configured to obtain electrical signals corresponding to cardiac activity of the heart of the patient and periodically analyze a most recent electrical signal of the obtained electrical signals to detect an electrical conduction abnormality of the heart. The IMD adjusts a frequency at which the most recent electrical signal is analyzed based on at least one physiological parameter of the patient. For example, the IMD may increase the frequency at which the most recent electrical signal is analyzed when a heart rate parameter has significantly changed and the number of detected premature ventricular contractions (PVCs) is greater than or equal to a threshold number. In this manner, the most recent electrical signal is analyzed at a higher frequency in situations in which conduction abnormalities are more likely.
Public/Granted literature
- US20100286541A1 DETECTING ELECTRICAL CONDUCTION ABNORMALITIES IN A HEART Public/Granted day:2010-11-11
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