Invention Grant
- Patent Title: Data processing device, semiconductor integrated circuit device, and abnormality detection method
- Patent Title (中): 数据处理装置,半导体集成电路装置及异常检测方法
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Application No.: US13034236Application Date: 2011-02-24
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Publication No.: US08392643B2Publication Date: 2013-03-05
- Inventor: Ryoichi Yamaguchi , Hisashi Abe
- Applicant: Ryoichi Yamaguchi , Hisashi Abe
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-049449 20100305
- Main IPC: G06F13/24
- IPC: G06F13/24

Abstract:
A data processing device for detecting the abnormal operation of a CPU is provided. The data processing device comprises a CPU, an interrupt counter, and a counter-abnormal-value detection circuit. The interrupt counter increments a count value based on an interrupt start signal which is outputted in response to an interrupt signal indicative of an interrupt request to the CPU and which indicates that the interrupt request has been accepted, and decrements the count value based on an end-of-interrupt signal which indicates that processing corresponding to the interrupt has completed. The counter-abnormal-value detection circuit detects abnormalities by comparing the count value with a predetermined value.
Public/Granted literature
- US20110219157A1 DATA PROCESSING DEVICE, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND ABNORMALITY DETECTION METHOD Public/Granted day:2011-09-08
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