Invention Grant
- Patent Title: Technique for estimation of confidence interval for probability of defect rediscovery
- Patent Title (中): 用于估计缺陷重新发现概率的置信区间的技术
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Application No.: US12625355Application Date: 2009-11-24
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Publication No.: US08392763B2Publication Date: 2013-03-05
- Inventor: Enzo Cialini , David R Godwin , Andriy V Miranskyy
- Applicant: Enzo Cialini , David R Godwin , Andriy V Miranskyy
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: North Shore Patents, P.C.
- Agent Michele Liu Baillie
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A present invention for estimating a confidence interval includes: receiving a dataset comprising information on software product defects found by a first customer and a second customer, the information comprising numbers of cases of software product defects found by the first customer and the second customer; determining a probability for each case of found software product defect using the frequencies and a total number of software product defects found; determining a plurality of bootstrapping draws from the cases of found software product defects in the dataset; determining an array of conditional probabilities that the first customer may find a given software product defect given that the second customer found the given software product defect, using the numbers of the cases and the probabilities corresponding to the cases in each bootstrapping draw; and determining a confidence interval for the determined plurality of arrays of conditional probabilities.
Public/Granted literature
- US20110125654A1 Technique for Estimation of Confidence Interval for Probability of Defect Rediscovery Public/Granted day:2011-05-26
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