Invention Grant
- Patent Title: Delay fault diagnosis program
- Patent Title (中): 延迟故障诊断程序
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Application No.: US12761335Application Date: 2010-04-15
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Publication No.: US08392776B2Publication Date: 2013-03-05
- Inventor: Daisuke Ito , Hiroki Yamanaka , Yasuo Sato
- Applicant: Daisuke Ito , Hiroki Yamanaka , Yasuo Sato
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Miles and Stockbridge P.C.
- Priority: JP2009-099522 20090416
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An extraction unit of fault assumption and a finish-point FF is provided, the fault assumption is selected from fault assumption information, and a logic trace is executed from the fault assumption toward an output side. A test result of a finish-point FF obtained as a result of the trace from the fault assumption is determined. The maximum value and the minimum value of the propagation route up to the finish-point FF are determined, and a delay margin is determined from the values. A delay range is determined by using the delay margin and the test result, and a fault candidate and a delay range of the delay fault are specified by the process of the determination of the fault candidate and the delay range.
Public/Granted literature
- US20100269003A1 DELAY FAULT DIAGNOSIS PROGRAM Public/Granted day:2010-10-21
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