Invention Grant
- Patent Title: Log-likelihood-ratio (LLR) table calibration
- Patent Title (中): 对数似然比(LLR)表校准
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Application No.: US12901357Application Date: 2010-10-08
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Publication No.: US08392809B1Publication Date: 2013-03-05
- Inventor: Nedeljko Varnica , Seo-How Low , Gregory Burd
- Applicant: Nedeljko Varnica , Seo-How Low , Gregory Burd
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: H03M13/03
- IPC: H03M13/03

Abstract:
Some of the embodiments of the present disclosure provide a system, device and a method performing N read cycles on a plurality of memory cells of a memory sector, wherein N is an integer greater than one; constructing (N+1) bin histograms based at least in part on performing the N read cycles; identifying a shortest bin histogram of the (N+1) bin histograms; and based on a height of the shortest histogram, assigning a log-likelihood ratio (LLR) to the shortest bin histogram. Other embodiments are also described and claimed.
Information query
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