Invention Grant
US08392809B1 Log-likelihood-ratio (LLR) table calibration 有权
对数似然比(LLR)表校准

Log-likelihood-ratio (LLR) table calibration
Abstract:
Some of the embodiments of the present disclosure provide a system, device and a method performing N read cycles on a plurality of memory cells of a memory sector, wherein N is an integer greater than one; constructing (N+1) bin histograms based at least in part on performing the N read cycles; identifying a shortest bin histogram of the (N+1) bin histograms; and based on a height of the shortest histogram, assigning a log-likelihood ratio (LLR) to the shortest bin histogram. Other embodiments are also described and claimed.
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