Invention Grant
- Patent Title: Near-field scanning optical microscope
- Patent Title (中): 近场扫描光学显微镜
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Application No.: US13015701Application Date: 2011-01-28
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Publication No.: US08393010B2Publication Date: 2013-03-05
- Inventor: Chih-Wen Chen , Jyh-Rou Sze , Din-Ping Tsai , Fong-Zhi Chen
- Applicant: Chih-Wen Chen , Jyh-Rou Sze , Din-Ping Tsai , Fong-Zhi Chen
- Applicant Address: TW Taipei
- Assignee: National Applied Research Laboratories
- Current Assignee: National Applied Research Laboratories
- Current Assignee Address: TW Taipei
- Agency: Wang Law Firm, Inc.
- Agent Li K. Wang; Stephen Hsu
- Priority: TW99144078A 20101215
- Main IPC: G01Q60/18
- IPC: G01Q60/18 ; G01Q20/02

Abstract:
A near-field scanning optical microscope is disclosed. The microscope includes a lighting component, a probe and an ellipsoidal mirror. The lighting component emits a light. The probe is disposed on one side of a testing sample, and the light is focused around a probe tip to draw the near-field light out. The ellipsoidal mirror has a first focal point and a second focal point, and the first focal point and the probe tip are disposed at the corresponding positions, and the near-field light drawn out from the probe tip is scattered from the first focal point inside the ellipsoidal mirror, and reflected and passed through the second focal point.
Public/Granted literature
- US20120159677A1 NEAR-FIELD SCANNING OPTICAL MICROSCOPE Public/Granted day:2012-06-21
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