Invention Grant
- Patent Title: Capacitive detector, method for manufacturing same, and device for measuring the integral
- Patent Title (中): 电容式检测器及其制造方法以及积分测量装置
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Application No.: US12936153Application Date: 2009-03-12
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Publication No.: US08393209B2Publication Date: 2013-03-12
- Inventor: Pierre Thibault
- Applicant: Pierre Thibault
- Applicant Address: FR Saint Martin d'Uriage
- Assignee: Universite Joseph Fourier
- Current Assignee: Universite Joseph Fourier
- Current Assignee Address: FR Saint Martin d'Uriage
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Eric B. Meyertons
- Priority: FR0852271 20080404
- International Application: PCT/FR2009/050407 WO 20090312
- International Announcement: WO2009/122061 WO 20091008
- Main IPC: G01F23/26
- IPC: G01F23/26 ; G08B21/00

Abstract:
Capacitive detector and measuring device integrating it; the detector including: a ribbon made of a dielectric material, first and second electrodes in the form of combs formed on a first surface of said ribbon and a third electrode formed on the other surface of said ribbon opposite said first and second electrodes; the thickness (e) of the dielectric ribbon is less than or equal to said determined period (λ) divided by four times PI, i.e.: λ/4π≧e; and the ratio resulting from the division, as numerator, of the capacitance (C) between two adjacent branches of said first and second electrodes in the presence of at least one fluid with a dielectric permittivity (∈f) and, as denominator, by the dielectric permittivity (∈f) of the fluid multiplied by the capacitance (Co) between the two adjacent branches of the first and second electrodes in the presence of the vacuum is greater than or equal to one, i.e.: C/(∈f*Co)≧1. Method for manufacturing a detector fulfilling the above conditions.
Public/Granted literature
- US20110107833A1 CAPACITIVE DETECTOR, METHOD FOR MANUFACTURING SAME, AND DEVICE FOR MEASURING THE INTEGRAL Public/Granted day:2011-05-12
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